Enabling Nano-Scale Technology in Manufacturing
Capabilities

S-FIL® has been specifically designed as a bi-layer process to facilitate the creation of high resolution, high aspect ratio structures. By using a halogen break-through etch to eliminate the residual layer and a subsequent oxygen etch on the planarization layer, high aspect ratio features can be created, as shown below.


Courtesy of the University of Texas and Sematech

Copyright 2008